Exhibitor Workshops

 

- free to attend -

 

 

 

 

 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 

Keysight Technologies Workshops

Location: NCC East, Level 2, Room Helsinki

In today’s environment, to reach, or remain at the forefront of fast-paced technology industries, continuous learning
is fundamental. Keysight HOTSPOTS are technical seminars that facilitate this learning process by offering the in-depth
and up-to-date information relevant to your industry, your current job role and to the role you aspire to.

For more than 75 years Keysight Technologies has been aiding scientists, researchers and engineers to address their
measurement challenges with precision and confidence. Keysight’s legacy is the original business of Hewlett-Packard
founded in 1939, then trading as Agilent’s EMG group, and subsequently becoming a fully independent company.
Throughout these changes, Keysight has enabled cutting edge electronic products to get to market faster and at a
lower cost.

Tuesday 10th October 09:30 – 17:30
Hotspots: RF and Microwave Measurement Insights

From the company that has been a leading innovator in Spectrum and Network measurements for 70 years, please join us for a
FREE RF and Microwave Fundamentals Seminar to help improve your understanding of basic RF measurements, including real
applications, thus improving your efficiency and effectiveness whether you are in R&D or design & test.

You can see our latest solutions, and expand on the practical knowledge you need to have to perform your day-to-day
measurements. Application and product experts from Keysight will be on-hand to give demonstrations and technical presentations
around the latest innovations, features and capabilities that enhance the fundamental measurements.


Topic 1: Spectrum Analysis Fundamentals
“Insight into the fundamentals of Spectrum Analysis with Keysight experts”
This presentation is intended to be a beginning tutorial on signal analysis. Vector signal analysis includes but is not restricted to
spectrum analysis. It is written for those who are unfamiliar with spectrum analysers and vector signal analysers, and would like a
basic understanding of how they work, what you need to know to use them to their fullest potential, and how to make them more
effective for particular applications. It is written for new engineers and technicians, therefore a basic understanding of electrical
concepts is recommended.

We will begin with an overview of spectrum analysis. In this section, we will define spectrum analysis as well as present a brief
introduction to the types of tests that are made with a spectrum and signal analyser. From there, we will learn about spectrum and signal analysers in terms of the hardware inside, what the importance of each component is, and how it all works together. In order to make measurements on a signal analyser and to interpret the results correctly, it is important to understand the characteristics of the
analyser. Spectrum and signal analyser specifications will help you determine if a particular instrument will make the measurements
you need to make, and how accurate the results will be.

Topic 2: Vector Signal Analysis Fundamentals
“Insight into signal complexity with the 89600 VSA Software”
This presentation continues from previous to delve into Vector Signal Analysis. The 89600 VSA software supports over 75 signal
types. We have a track record of being first-to-market for new technologies. Recent examples include both LTE-Advanced and
802.11ac and we continue to lead the market with features and enhancements. For A/D customers, now we offer pulse and FMCW
radar analysis along with flexible custom demodulators to enable analysis of non-standard or proprietary signals with industry
standard tools.

Topic 3: RF Power Measurement Basics
“Insight into RF Power Measurements with Keysight Experts”

This presentation is a tutorial on RF power measurement which covers the importance, types, and methods of power measurements.
It also describes the different types of power sensor technologies – thermistor, thermocouple and diode detector. Last but not least,
we describe the advanced measurements used for the latest RF and microwave applications and power measurement uncertainty
calculation.

Topic 4: Network Analysis Fundamentals
“Insight into the fundamentals of Network Analysis with Keysight Experts”

This presentation provides a review on RF basics, understanding of S-parametre measurements and the examination of the
architectures and calibrations of VNAs.

A vector network analyser (VNA) is a precision measuring tool that tests the electrical performance of high frequency components,
in the radio frequency (RF), microwave, and millimetre-wave frequency bands (we will use the generic term RF to apply to all
of these frequencies). A VNA is a stimulus-response test system, composed of an RF source and multiple measurement receivers. It is specifically designed to measure the forward and reverse reflection and transmission responses, or S-parameters, of RF components. S-parameters have both a magnitude and a phase component, and they characterise the linear performance of the DUT. While VNAs can also be used for characterising some non-linear behaviour like amplifier gain compression or intermodulation distortion, S-parameters are the primary measurement. The network analyser hardware is optimised for speed, yielding swept measurements that are faster than those obtained from the use of an individual source and an individual receiver like a spectrum analyser. Through calibration, VNAs provide the highest level of accuracy for measuring RF components.

Topic 5: RF Design & Simulation fundamentals
“Insight into RF/MW designs with Keysight Experts”

This session is a tutorial on Design Simulation technology and tools from Keysight EDA EEsof.

We will demonstrate S-parametre simulation, impedance matching, tuning, optimisation and device modelling. X-parameters are
introduced and the integration of S-parameters into test/design is explained. Both ADS & Genesys software will be used for
demonstration purposes.

Wednesday 11th October 09:30 – 17:30
Hotspots: Materials and Devices Measurement Insights

Understanding the properties of materials (both natural and man-made) is important for a variety of reasons. Materials such
as metallic materials, semiconductors, organic materials (such as polymers) and compound semiconductors have provided profound
benefits over the last century. New and emerging materials such as oxide semiconductors, carbon nano tubes (CNT) and graphene
promise to provide new benefits over the coming century. Keysight Technologies continues to develop and introduce test and
measurement equipment to cope with the evolving demands of researchers. This paper gives an overview of the most emerging
technologies and what Keysight can offer to solve the most daunting measurement challenges.

Topic 1: Challenges and Solutions for Material Science/ Engineering Testing Application
Material science testing is a challenging task due to the fact that every material is unique in terms of its electrical, optical and
structural properties. It is these unique material properties that allow devices and components such as solar cells, sensors, logic
devices, memories, interconnect, displays, emitters, packaging materials to perform their specified tasks. In this presentation we
will discuss typical electrical measurement methods for a variety of materials and present the test instruments and solutions that
Keysight can provide for defining and assembling material testing solutions.

Topic 2: Advanced Testing Solutions for Impedance Measurements
This presentation is aimed to focus on basics impedance measurement and its applications. Also, the correct techniques
for making accurate impedance measurements on components such as capacitors, inductors and transformers will be discussed.
You will gain an understanding on the reasons for measurement discrepancies, the sources of measurement error and how to
compensate for these errors. A discussion on the advantages and disadvantages of the different measurement techniques
employed will assist you in selecting the right instrument for your measurement need.

Topic 3: Devices & Material Characterisation from DC to mm-wave & THz
From stealth materials to dielectric substrates, microwave food products to biofuels, accurate characterisation of their
electromagnetic properties at microwave and mm-wave frequencies provide engineers with critical information needed for
material and circuit design, modelling, research, manufacturing and quality control. In this paper we will overview the classes of
methods employed to measure the dielectric properties of solids and liquids and will discuss the criteria one should consider when
selecting a measurement technique. The focus will be on those techniques useful for measuring the relative permittivity and
loss tangent of dielectric materials, both liquid and solid, over a frequency range that covers 100 MHz to 1.1 THz.

Topic 4: Electrical Characterisation of GaN & SiC devices with the Keysight B1505A
Rapid advances in power device technology are rendering conventional measurement equipment a thing of the past. High
current conduction tests of more than 1000A, sub pico-ampere leakage current measurements and evaluation of breakdown
voltages of up to10+kV become ever more important. In this presentation we will discuss typical IV and CV measurements on
GaN and SiC power devices using the Keysight B1505A power device analyser.

  
Agenda for Thursday 12th is published on Keysight’s website.

Pre-Register now at www.keysight.com/find/hotspots

 

 

 

 

 

 

Keysight Technologies Workshops

Location: NCC East, Level 2, Room Helsinki

- See more at: http://eumweek.edit.neptuneweb.com/exhibition/Exhibitor-Workshops.html#sthash.DJMz1ePY.dpuf

 

IHP Workshop

Location: Exhibition Hall Room (Far right hand corner)

- Free to attend -

 For registration visit ihp-microelectronics.com/EuMW2017

 

Thursday 12th October 09:30 – 13:00
16th Workshop "High Performance SiGe BiCMOS Technology Platform for innovative
RF and Photonic ICs"

The Workshop delivers firsthand information about IHP's technologies, services and integrated circuits. IHP`s offerings
are very suitable for demanding applications such as wireless and broadband communication, medical technology, aerospace,
mobility, wireless security, and industrial automation.

Agenda:
9:30 - 10:10
Latest Developments on SiGe BiCMOS Technologies with “More-than-Moore” Modules for mm-wave and THz
Applications - M. Kaynak

In last decade, SiGe BiCMOS technologies open a new cost-efficient market at mm-wave frequencies. The latest developments on SiGe HBTs with fmax of beyond 700 GHz boosts the research and development effort on circuit and system area to take share from the new market. In parallel to the developments on SiGe HBT performance, “More-than-Moore” path, which covers all the additional functionalities to the standard CMOS process (i.e. MEMS devices, microfluidics, photonics, heterogeneous integration, etc…), allows to realize multi-functional circuits and systems. In this talk, the latest developments regarding the high-speed devices and heterogeneous integration techniques at IHP will be discussed.

10:10 - 10:50
Photonic BiCMOS Technology for High-Speed Photonic- Electronic Integration - L. Zimmermann

In this talk, a new monolithic platform technology for co-integration of silicon photonics with high-performance BiCMOS will be
presented. The main application of the technology is in the area of RF frontends for implementing effi cient sub-systems in highspeed
optical communications. Present status of the technology will be reviewed; future developments toward 400G systems will
be addressed; pros and cons in comparison to other integration technologies will be discussed.

10:50 - 11:10 Coffee Break

11:10 - 11:50
Overview on MPW Offerings and Process Design Kit Features – R.F. Scholz

IHP offers research partners and customers access to its powerful cutting edge SiGe:C BiCMOS technologies. Integrated HBTs provide cut-off frequencies of up to 500 GHz. Special integrated RF modules like RF MEMS, Through Silicon Vias, Localized Backside Etching, and ultra fast pnp HBTs are available. Technology overview, MPW schedule, and PDK news for 2018 will be presented.

11:50 - 12:30
Integrated Broadband and High-Frequency Circuit Platforms in SiGe BiCMOS Technology - D. Kissinger

This talk presents integrated circuit solutions up to 500 GHz in highperformance IHP BiCMOS technologies. These include broadband
drivers and transimpedance amplifi ers for high-speed fiberoptical communication systems, as well as transceiver platforms for wireless data communication and radar sensors. Several state-of-the-art circuit realizations are outlined to demonstrate the capabilities and potential of modern SiGe BiCMOS technologies.

12:30 Lunch

 

 

 

 

 

 

National Instruments Workshops

Location: NCC East, Level 2, Room Krakau

- Free to attend -

Tuesday 10th October 13:00 – 16:00
Intuitive Microwave Filter Design
Overview:

This 3-hour workshop, presented by Dan Swanson from SW Filter Design, will focus on two detailed filter design examples
using NI AWR Design Environment and SW Filter Design software. The first example is a microstrip combline filter and the second is a narrow-band, high Q-cavity combline filter. The same design strategy, based on Dishal’s method and port tuning, will be used for both filters.

• Step 1 will be to determine the required coupling coefficients and external Q for our filter.
• Step 2 will be to define a suitable resonator that has enough unloaded Q to meet our insertion loss requirement.
• Step 3 will be to build design curves that relate coupling coefficients and external Q to physical dimensions in our filter.
• Step 4 we will build a virtual prototype of the complete filter and apply port tuning. The port tuning procedure will demonstrate how to adjust each resonator frequency and all the couplings between resonators, including cross-couplings.
• Step 5 we will build a two-port EM model of our filter and confirm that we are meeting our specification.

To view the complete agenda and to register, visit:
awrcorp.com/eumw2017  


Wednesday 11th October 10:00 – 16:00
RF/Microwave Power Amplifier (PA) Forum

The fourth annual EuMW RF and Microwave PA Forum will focus on device technologies, characterisation, modelling and end-use
applications of RF and microwave PAs. The forum aims to encourage discussion and provide insight into the latest approaches to device models, parametre extraction measurement techniques, process technologies as well as modern PA design flow and theory. The forum’s agenda is segmented into sequential sessions to allow attendees to selectively attend any/all presentations of interest.

Presentation Highlights:
• Keynote: The Outphasing PA: Revisiting 80 Years of Questionable Assumptions and Unrealised Performance Potential
Dr. Steve C. Cripps - Cardiff University
• First Pass Design Methodology for a 0.7 - 2.7 GHz 100 W RFPA
Jack Brunning - SARAS Technology
• Introducing STORM - Near 0dB PAPR Waveform of mmWave 5G
Dr. Doron Ezri - Tel-Aviv Research Center, Huawei
• Cardiff Model+ Investigating Bias and Frequency Interpolation   
Dr. Tudor Williams - Mesuro
• And many more

To view the complete agenda and to register, visit awrcorp.com/eumw2017


Thursday 12th October 10:00 – 13:00
Software Defined Radio Hands-On: FPGA Prototyping with Over-the-Air Signals

NI SDR solutions scale from design and prototyping, to deployment, enabling faster innovation and accelerated results.
Attend this hands-on session to see first-hand how the LabVIEW Communications System Design Suite, when paired with NI
USRP-RIO hardware, can accelerate productivity and drive rapid innovation. During this session, attendees will:

• Build an FM radio
• Create a real-time LTE link between two USRP-RIOs and transmit video on the downlink
• Explore LTE and WiFi coexistence
• Learn how leading researchers are leveraging NI SDR solutions to break world-records in spectral efficiency with Massive
MIMO, prove out FD-MIMO as a candidate technology for 5G, and experiment on LTE/WiFi coexistence in real-world conditions

To view the complete agenda and to register, visit ni.com/eumw

 

 

 

 

Rohde & Schwarz Workshops

Location: NCC East, Level 2, Room Budapest

For more information, details and registration visit www.eumw.rohde-schwarz.com
 

- Free to attend -

Tutorial Seminars - RF Basics in Test and Measurement

 

Tutorial abstract:
The RF world is rapidly changing as more and more digital communications standards such as 5G and WLAN 801.11ad/ay move into the mmWave world. Traditional methods of designing RF boards and components become design aspects of microwave boards and module development. Today, many mmWave engineers are confronted with new design challenges that are more or less typical for RF design engineers. Such design procedures may differ from the daily routine of mmWave engineers.

These RF basics and fundamentals will familiarize you with using a vector network analyzer for component testing and evaluation, which is still a classical field of mmWave engineering. Insight into digital modulation schemes, signals and the underlying aspects of fading in digital communications systems will help mmWave engineers understand the challenges that the communications
industry faces today. A look at the fundamental aspects of signal generators and spectrum analyzers will show mmWave engineers the great flexibility that exists when designing communications systems, radar systems and solutions.

Tuesday 10th October 2017                                            09:30 – 11:00
Fundamentals of Vector Network Analysis

Tuesday 10th October 2017                                            11:15 – 12:45
Calibration in Vector Network Analysis

Wednesday 11th October 2017                                       09:30 – 11:30
Introduction to Digital Signals and Digital
Modulation

Wednesday 11th October 2017                                       11:45 – 13:15
Understanding Fading and its Effects

Thursday 12th October 2017                                           9:30 – 10:30
Fundamentals of Signal Generators and
Oscillators (YIG vs. VCO)

Thursday 12th October 2017                                          10:45 – 12:15
Fundamentals of Spectrum Analysis

    

 

Technical Workshops

 

 

Tuesday 10th October 2017 13:30 – 17:30
RF & Microwave Component Testing
Workshop Chair: Markus Lörner, Market Segment Manager RF & Microwave Components, Rohde & Schwarz

The design of all involved millimeter components is becoming more complex in order to fulfill the stricter requirements associated with higher bandwidths and frequencies. Power amplifiers have a strong impact on the overall system performance and require special attention. The new architectures with beamforming antennas use multiple elements and require many PAs to drive them. They need to become smaller and more efficient to enable the necessary high degree of integration.

This workshop discusses how to verify the performance of components like PAs, converters, mixers and filters for these emerging applications. Experts from the test and measurement world will provide answers on how to verify the demanding requirements placed on new components.

Wednesday 11th October 2017 13:30 – 17:30
5G Communications
Workshop Chair: Meik Kottkamp, 5G Technology Manager, Rohde & Schwarz

LTE, including all its enhancements in LTE-Advanced and LTE-Advanced Pro, has become the dominant cellular technology. It provides the evolutionary path towards 5G, namely New Radio (NR) in 3GPP. NR will be specified in 3GPP within the Release 15 timeframe. In particular, non-standalone operation with LTE-A Pro will be completed by the end of 2017. Revolutionary aspects of NR include the use of the cmWave and mmWave spectrum with advanced antenna implementation. This enables dynamic beam steering in combination with spatial multiplexing known as massive MIMO.

This workshop discusses the key technology components relevant to using the cmWave and mmWave spectrum. R&D measurement aspects will be explained in detail, with a focus on verifying massive MIMO antenna. 5G coverage measurement solutions in the field will also be illustrated. Experts from the test and measurement world will provide answers on how to most efficiently solve the main verification tasks resulting from NR. 

Thursday 12th October 2017 12:30 – 16:30 
Radar Applications
Workshop Chair: Dr. Steffen Heuel, Technology Manager A&D, Rohde & Schwarz

Radar has been around for more than one hundred years, ever since Christian Hülsmeyer from Germany patented his “Telemobiloskop” in 1904. Since then, radar has been applied in a variety of applications such as presence detection, air traffic control, military use and even automotive. These different applications need different radar systems that make use of various frequencies, signals and processing and require versatile test and measurement methods. This workshop presents the latest radar test and measurement developments – from signal generation, wideband analysis and phase noise testing to simulated RF environments for testing the many radar requirements.

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The European Microwave Association (EuMA) is an international non-profit association with a scientific, educational and technical purpose. The aim of the Association is to develop in an interdisciplinary way, education, training and research activities. [more]

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