Exhibitor Workshops

 

- free to attend -

 

 

 

 

 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 

Keysight Technologies Workshops

Location: NCC East, Level 2, Room Helsinki

Tuesday 10th October 09:30 – 17:30

 

Hotspots: RF and Microwave Measurement InsightsFrom the company that has been a leading innovator in Spectrum
and Network measurements for 70 years, please join us for a FREE RF and Microwave Fundamentals Seminar to help improve your
understanding of basic RF measurements, including real applications, thus improving your efficiency and effectiveness whether you are in R&D or design & test. You can see our latest solutions, and expand on the practical knowledge you need to have to perform your day to- day measurements. Application and product experts from Keysight will be on-hand to give demonstrations and technical presentations around the latest innovations, features and capabilities that enhance the fundamental measurements.

 


Topic 1: Spectrum Analysis Fundamentals
“Insight into the fundamentals of Spectrum Analysis with Keysight experts”
This presentation is intended to be a beginning tutorial on signal analysis. Vector signal analysis includes but is not restricted to
spectrum analysis. It is written for those who are unfamiliar with spectrum analysers and vector signal analysers, and would like a
basic understanding of how they work, what you need to know to use them to their fullest potential, and how to make them more effective for particular applications. It is written for new engineers and technicians, therefore a basic understanding of electrical concepts is recommended. We will begin with an overview of spectrum analysis. In this section, we will define spectrum analysis as well as present a brief introduction to the types of tests that are made with a spectrum and signal analyser. From there, we will learn about spectrum and signal analysers in terms of the hardware inside, what the importance of each component is, and how it all works together. In order to make measurements on a signal analyser and to interpret the results correctly, it is important to understand the characteristics of the analyser. Spectrum and signal analyser specifications will help you determine if a particular instrument will make the measurements you need to make, and how accurate the results will be.

Topic 2: Vector Signal Analysis Fundamentals
“Insight into signal complexity with the 89600 VSA Software”
This presentation continues from previous to delve into Vector Signal Analysis. The 89600 VSA software supports over 75 signal types. We have a track record of being first-to-market for new technologies. Recent examples include both LTE-Advanced and 802.11ac and we continue to lead the market with features and enhancements. For A/D customers, now we offer pulse and FMCW radar analysis along with flexible custom demodulators to enable analysis of non-standard or proprietary signals with industry standard tools.standard tools.

Topic 3: RF Power Measurement Basics
“Insight into RF Power Measurements with Keysight Experts”

This presentation is a tutorial on RF power measurement which covers the importance, types, and methods of power measurements.
It also describes the different types of power sensor technologies – thermistor, thermocouple and diode detector. Last but not least, we describe the advanced measurements used for the latest RF and microwave applications and power measurement uncertainty
calculation.

Topic 4: Network Analysis Fundamentals
“Insight into the fundamentals of Network Analysis with Keysight Experts”

This presentation provides a review on RF basics, understanding of S-parametre measurements and the examination of the architectures and calibrations of VNAs. A vector network analyser (VNA) is a precision measuring tool that tests the electrical performance of high frequency components, in the radio frequency (RF), microwave, and millimetre-wave frequency bands (we will use the generic term RF to apply to all of these frequencies). A VNA is a stimulus-response test system, composed of an RF source and multiple measurement receivers. It is specifically designed to measure the forward and reverse reflection and transmission responses, or S-parameters, of RF components. S-parameters have both a magnitude and a phase component, and they characterise the linear performance of the DUT. While VNAs can also be used for characterising some nonlinear behaviour like amplifier gain compression or intermodulation distortion, S-parameters are the primary measurement. The network analyser hardware is optimised for speed, yielding swept measurements that are faster than those obtained from the use of an individual source and an individual receiver like a spectrum analyser. Through calibration, VNAs provide the highest level of accuracy for measuring RF components.

Topic 5: RF Design & Simulation fundamentals
“Insight into RF/MW designs with Keysight Experts”

This session is a tutorial on Design Simulation technology and tools from Keysight EDA EEsof. We will demonstrate S-parametre simulation, impedance matching, tuning, optimisation and device modelling. X-parameters are introduced and the integration of S-parameters into test/design is explained. Both ADS & Genesys software will be used for demonstration purposes.

Wednesday 11th October 09:30 – 17:30
Hotspots: Materials and Devices Measurement Insights

Understanding the properties of materials (both natural and manmade) is important for a variety of reasons. Materials such as metallic
materials, semiconductors, organic materials (such as polymers) and compound semiconductors have provided profound benefits
over the last century. New and emerging materials such as oxide semiconductors, carbon nano tubes (CNT) and graphene promise to
provide new benefits over the coming century. Keysight Technologies continues to develop and introduce test and measurement equipment to cope with the evolving demands of researchers. This paper gives an overview of the most emerging technologies and what Keysight can offer to solve the most daunting measurement challenges.

Topic 1: Challenges and Solutions for Material Science/ Engineering Testing Application
Material science testing is a challenging task due to the fact that every material is unique in terms of its electrical, optical and structural properties. It is these unique material properties that allow devices and components such as solar cells, sensors, logic devices, memories, interconnect, displays, emitters, packaging materials to perform their specified tasks. In this presentation we will discuss typical electrical measurement methods for a variety of materials and present the test instruments and solutions that Keysight can provide for defining and assembling material testing solutions.

Topic 2: Advanced Testing Solutions for Impedance Measurements
This presentation is aimed to focus on basics impedance measurement and its applications. Also, the correct techniques for making accurate impedance measurements on components such as capacitors, inductors and transformers will be discussed. You will gain an understanding on the reasons for measurement discrepancies, the sources of measurement error and how to compensate for these errors. A discussion on the advantages and disadvantages of the different measurement techniques employed will assist you in selecting the right instrument for your measurement need.

Topic 3: Devices & Material Characterisation from DC to mm-wave & THz
From stealth materials to dielectric substrates, microwave food products to biofuels, accurate characterisation of their electromagnetic properties at microwave and mm-wave frequencies provide engineers with critical information needed for material and circuit design, modelling, research, manufacturing and quality control. In this paper we will overview the classes of methods employed to measure the dielectric properties of solids and liquids and will discuss the criteria one should consider when selecting a measurement technique. The focus will be on those techniques useful for measuring the relative permittivity and loss tangent of dielectric materials, both liquid and solid, over a frequency range that covers 100 MHz to 1.1 THz.

Topic 4: Electrical Characterisation of GaN & SiC devices with the Keysight B1505A
Rapid advances in power device technology are rendering conventional measurement equipment a thing of the past. High current conduction tests of more than 1000A, sub pico-ampere leakage current measurements and evaluation of breakdown voltages of up to10+kV become ever more important. In this presentation we will discuss typical IV and CV measurements on GaN and SiC power devices using the Keysight B1505A power device analyser.

Thursday 12th October 09:10 – 16:00
Improving accuracy and predictability of mm- Wave Systems using EDA tools

Today’s technologies for high frequency applications like 5G, (automotive) radar and satellite demand highly integrated modules
including phased array antennas, GaN devices and nanoscale RFsilicon technologies. While the complexity of these modules increases, it becomes more important to quantify the effects of cross-talk, thermal effects, etc. In these sessions Keysight Technologies, together with industry partners, will show a complete design flow and latest technology updates including electro-magnetic and electro-thermal simulations to help predict the behavior of the circuits in order to achieve design goals.

09:10 - 10:20
System Design Aspects for mm-Wave Application

Wideband mm-Wave systems put high demands on linearity, bandwidth, and noise performance for the underlying transceiver
ICs and modules. It is now crucial to anticipate the true modulated system-level performance, such as EVM, ACPR, and BER, which can vary significantly, depending on the standard.

10:30 - 12:50
Addressing mm-Wave RFIC/MMIC Design Challenges and its Integration in Multi-technology Systems

Applying integrated electro-magnetic simulators to help quantify the effects of integration and coupling between various technologies as well as analyzing packaging.

12:50 - 13:50
How to Improve mm-Wave Circuit Performance & Reliability using Electro-Thermal Analysis

Thermal issues cause significant problems for today’s mm-Wave designs implemented in GaAs, GaN, SiGe and SOI processes. Fortunately, new design tools and techniques based on electro-thermal analysis can help designers identify and correct thermal problems before it’s too late. This webcast illustrates a design methodology that utilizes the combination of electro-thermal simulation technology, and electrothermal- enabled process design kits (PDKs) from RF foundry partners.

5G Workshop
This informative, free workshop highlights new ideas for exploring the brave new world of 5G New Radio, as well as the unlicensed bands around 60 GHz.

14:00 - 16:00
Testing the Limits of 5G New Radio, and Life Beyond the Licensed Bands

First, explore the key changes and implications of the coming “Non Stand Alone” release of the New Radio standard, truly the dawn of the 5G age. Look at key innovations in the physical layer waveform structure, performance issues, and the systems that will be used to validate 5G New Radio designs. The workshop continues by exploring the evolution of the 5G radio access network (RAN), and the new challenges such as beamforming and spatial compliance, non-connectorized tests, and an accelerated transition to volume production. Finally, life beyond the licensed New Radio bands continues with innovative business models and technologies around 60 GHz are driving new wideband applications like 802.11ay, direct access, and wireless backhaul. The final section will examine new approaches for these wider, more difficult bands that have defied previous generations of designers. Together, this workshop will enable millimeter wave designers, test and validation engineers, and engineering managers to capture new insights from the latest trends in the 5G and Test & Measurement, in order to accelerate their own product journey.

Pre-register now at www.keysight.com/find/eumw2017   

 

 

 

 

 

Keysight Technologies Workshops

Location: NCC East, Level 2, Room Helsinki

- See more at: http://eumweek.edit.neptuneweb.com/exhibition/Exhibitor-Workshops.html#sthash.DJMz1ePY.dpuf

 

IHP Workshop

Location: Exhibition Hall Room (Far right hand corner)

- Free to attend -

 For registration visit ihp-microelectronics.com/EuMW2017

 

Thursday 12th October 09:30 – 13:00
16th Workshop "High Performance SiGe BiCMOS Technology Platform for innovative
RF and Photonic ICs"

The Workshop delivers firsthand information about IHP's technologies, services and integrated circuits. IHP`s offerings
are very suitable for demanding applications such as wireless and broadband communication, medical technology, aerospace,
mobility, wireless security, and industrial automation.

Agenda:
9:30 - 10:10
Latest Developments on SiGe BiCMOS Technologies with “More-than-Moore” Modules for mm-wave and THz
Applications - M. Kaynak

In last decade, SiGe BiCMOS technologies open a new cost-efficient market at mm-wave frequencies. The latest developments on SiGe HBTs with fmax of beyond 700 GHz boosts the research and development effort on circuit and system area to take share from the new market. In parallel to the developments on SiGe HBT performance, “More-than-Moore” path, which covers all the additional functionalities to the standard CMOS process (i.e. MEMS devices, microfluidics, photonics, heterogeneous integration, etc…), allows to realize multi-functional circuits and systems. In this talk, the latest developments regarding the high-speed devices and heterogeneous integration techniques at IHP will be discussed.

10:10 - 10:50
Photonic BiCMOS Technology for High-Speed Photonic- Electronic Integration - L. Zimmermann

In this talk, a new monolithic platform technology for co-integration of silicon photonics with high-performance BiCMOS will be
presented. The main application of the technology is in the area of RF frontends for implementing effi cient sub-systems in highspeed
optical communications. Present status of the technology will be reviewed; future developments toward 400G systems will
be addressed; pros and cons in comparison to other integration technologies will be discussed.

10:50 - 11:10 Coffee Break

11:10 - 11:50
Overview on MPW Offerings and Process Design Kit Features – R.F. Scholz

IHP offers research partners and customers access to its powerful cutting edge SiGe:C BiCMOS technologies. Integrated HBTs provide cut-off frequencies of up to 500 GHz. Special integrated RF modules like RF MEMS, Through Silicon Vias, Localized Backside Etching, and ultra fast pnp HBTs are available. Technology overview, MPW schedule, and PDK news for 2018 will be presented.

11:50 - 12:30
Integrated Broadband and High-Frequency Circuit Platforms in SiGe BiCMOS Technology - D. Kissinger

This talk presents integrated circuit solutions up to 500 GHz in highperformance IHP BiCMOS technologies. These include broadband
drivers and transimpedance amplifi ers for high-speed fiberoptical communication systems, as well as transceiver platforms for wireless data communication and radar sensors. Several state-of-the-art circuit realizations are outlined to demonstrate the capabilities and potential of modern SiGe BiCMOS technologies.

12:30 Lunch

 

 

 

 

 

 

National Instruments Workshops

Location: NCC East, Level 2, Room Krakau

- Free to attend -

Tuesday 10th October 13:00 – 16:00
Intuitive Microwave Filter Design
Overview:
This 3-hour workshop, presented by Dan Swanson from SW Filter Design, will focus on two detailed filter design examples using NI AWR Design Environment and SW Filter Design software. The first example is a microstrip combline filter and the second
is a narrow-band, high Q-cavity combline filter. The same design strategy, based on Dishal’s method and port tuning, will be used for both filters.

• Step 1 will be to determine the required coupling coefficients and external Q for our filter.
• Step 2 will be to define a suitable resonator that has enough unloaded Q to meet our insertion loss requirement.
• Step 3 will be to build design curves that relate coupling coefficients and external Q to physical dimensions in our filter.
• Step 4 we will build a virtual prototype of the complete filter and apply port tuning. The port tuning procedure will demonstrate
how to adjust each resonator frequency and all the couplings between resonators, including cross-couplings.
• Step 5 we will build a two-port EM model of our filter and confirm that we are meeting our specification.

To view the complete agenda and to register, visit:
awrcorp.com/eumw2017

 
Wednesday 11th October 10:00 – 16:00
RF/Microwave Power Amplifier (PA) Forum
The fourth annual EuMW RF and Microwave PA Forum will focus on device technologies, characterisation, modelling and end-use applications of RF and microwave PAs. The forum aims to encourage
discussion and provide insight into the latest approaches to device models, parametre extraction measurement techniques, process
technologies as well as modern PA design flow and theory. The forum’s agenda is segmented into sequential sessions to allow attendees to selectively attend any/all presentations of interest.

Presentations:
• Keynote: The Outphasing PA: Revisiting 80 Years of Questionable Assumptions and Unrealized Performance Potential
Dr. Steve Cripps, Cardiff University
• From On-Wafer Measurements to Customer Models: Ampleon’s Modeling Flow for LDMOS and GaN RF PA's
Dr. Marek Schmidt-Szalowski, Ampleon
• The Cardiff Model and Investigating Bias and Frequency Interpolation
Dr. Tudor Williams, MESURO
• Balun Design for a Wide Bandwidth L-Band 200 W PA
Dr. Dominic FitzPatrick, PoweRFul Microwave
• A GaN on SiC 0.25 μm Process for PA, LNA, and Switch Design
Eric Leclerc, UMS
• Using Load Pull With Nonlinear/Linear Models and the Maximum- Efficiency Line Approach to Design RF PA's
Ivan Boshnakov, ETL
• First Pass Design Methodology for a Broadband 100 W RFPA
Jack Brunning, SARAS Technology
• Introducing STORM: Near 0 dB Peak-to-Average Power Ratio Waveform for mmWave 5G
Dr. Doron Ezri, Huawei
• Digital Predistortion of RFPAs Using NI AWR Software
Dr. Tomas Gotthans, ESIEE
• A Comprehensive Behavioral Modeling Solution for System Simulation
Dr. Tony Gasseling, AMCAD Engineering
• Phased-Array Antenna Simulation for 5G
Steve Tucker, AWR Group, NI

To view the complete agenda and to register, visit:
awrcorp.com/eumw2017


Thursday 12th October 10:00 – 13:00
Software Defined Radio Hands-On: FPGA Prototyping with Over-the-Air Signals

NI SDR solutions scale from design and prototyping, to deployment, enabling faster innovation and accelerated results. Attend this handson session to see first-hand how the LabVIEW Communications System Design Suite, when paired with NI USRP-RIO hardware, can accelerate productivity and drive rapid innovation. During this session, attendees will:
• Build an FM radio
• Create a real-time LTE link between two USRP-RIOs and transmit video on the downlink
• Explore LTE and WiFi coexistence
• Learn how leading researchers are leveraging NI SDR solutions to break world-records in spectral efficiency with Massive MIMO,
prove out FD-MIMO as a candidate technology for 5G, and experiment on LTE/WiFi coexistence in real-world conditions

To view the complete agenda and to register, visit:
ni.com/eumw 

 

 

 

Rohde & Schwarz Workshops

Location: NCC East, Level 2, Room Budapest

For more information, details and registration visit www.eumw.rohde-schwarz.com
 

- Free to attend -

Tutorial Seminars - RF Basics in Test and Measurement

 

The RF world is rapidly changing as more and more digital communications standards such as 5G and WLAN 801.11ad/ay move into the mmWave world. Traditional methods of designing RF boards and components become design aspects of microwave boards and module development. Today, many mmWave engineers are confronted with new design challenges that are more or less typical for RF design engineers. Such design procedures may differ from the daily routine of mmWave engineers.

These RF basics and fundamentals will familiarize you with using a vector network analyzer for component testing and evaluation, which is still a classical field of mmWave engineering. Insight into digital modulation schemes, signals and the underlying aspects of fading in digital communications systems will help mmWave engineers understand the challenges that the communications industry faces today. A look at the fundamental aspects of signal generators and spectrum analyzers will show mmWave engineers the great flexibility that exists when designing communications systems, radar systems and solutions.

Tuesday 10th October 2017
09:30 – 11:00 Fundamentals of Vector Network Analysis

Tuesday 10th October 2017
11:15 – 12:45 Calibration in Vector Network Analysis

Wednesday 11th October 2017
09:30 – 11:30 Introduction to Digital Signals and Digital Modulation

Wednesday 11th October 2017
11:45 – 13:15 Understanding Fading and its Effects

Thursday 12th October 2017
9:30 – 10:30 Fundamentals of Signal Generators and Oscillators
(YIG vs. VCO)

Thursday 12th October 2017
10:45 – 12:15 Fundamentals of Spectrum Analysis

 

Technical Workshops

 

Tuesday 10th October 2017 13:30 – 17:30
RF & Microwave Component Testing
Workshop Chair: Markus Lörner, Market Segment Manager RF & Microwave Components, Rohde & Schwarz
  
New wireless communications technologies for commercial and governmental use as well as satellite links aim for higher data rates by using new spectrally efficient waveforms and higher bandwidths. To make room for these applications, carrier frequencies are going up. At the same time, directive antennas are becoming more common to address the increased free-field attenuation that comes with the higher frequencies.

The design of all involved millimeter components is becoming more complex in order to fulfill the stricter requirements associated with higher bandwidths and frequencies. Power amplifiers have a strong impact on the overall system performance and require special attention. The new architectures with beamforming antennas use multiple elements and require many PAs to drive them. They need to become smaller and more efficient to enable the necessary high degree of integration.

This workshop discusses how to verify the performance of components like PAs, converters, mixers and filters for these emerging applications. Experts from the test and measurement world will provide answers on how to verify the demanding requirements
placed on new components.

13:30 - 14:00 Components for 5G – What’s New?
Everyone is talking about 5G enabling enhanced throughput by using higher signal bandwidth and microwave frequencies. Many field trials are being conducted to understand the new environment. But what does all this mean for people in the component industry? They are the ones who need to supply the right building blocks to enable everything. This workshop session provides an overview of the relevant changes on the way to 5G and various trends to address them.

14:00 - 14:45 Evaluating High-Performance Direct RF Sampling Data Converters
[Presenter: Anthony Collins, Senior Staff Marketing Engineer, Xilinx]
This workshop session briefly outlines the technology trends driving the move to direct RF sampling for 5G and similar applications and explains why these functions will be increasingly integrated in advanced CMOS SoCs in the future. These wireless applications are driving very high levels of data converter performance which are outlined along with how this is achieved in advanced CMOS technology. Another topic is the challenge of testing high performance in a highly integrated solution, and the evaluation and testing platform is presented.

15:00 - 15:45 Improving Phase Noise Performance of DDS-Based Synthesizers
[Presenter: Peter Delos, Radar and Phased Array Applications Manager, Analog Devices, and David Tunkelrott, Business Development, RF & Microwave Components, Rohde & Schwarz]
DDS-based synthesizers offer various advantages such as extremely fast hopping. Thanks to advanced DAC techniques covering higher RF frequencies, these synthesizers are becoming more and more of interest in communications and radar applications. To
ensure they meet the requirements, special attention must be devoted to the additive phase noise of the DAC itself and how it is embedded in the design. The workshop session outlines the important facts and discusses test solutions for verifying the overall
phase noise of DDS-based synthesizers.

16:00 - 16:30 VNA Accuracy in TVAC Chambers and Multiport Systems
System error correction (also referred to as “user calibration”) is a must for achieving accurate S-parameters with vector network analyzers. However, the procedure takes time, is error prone, and – for instance – requires that the operator have access to the
reference plane. Regardless whether a manual kit or an automatic calibration unit is used, the calibration equipment must be connected for the calibration and disconnected for the measurement. Which means that calibration inside a TVAC chamber, with
vacuum applied and at low temperatures, is impossible with conventional calibration equipment. And even under common ambient conditions, multiport (re )calibration is quite elaborate.

Using in-line calibration units, a solution for satellite TVAC testing and efficient multiport calibration is presented. The units remain connected in the test setup, and a system error correction can be performed at any time without reconnecting calibration equipment. The workshop session introduces technical details about the handling, configuration and typical applications of such in-line calibration units.

16:30 - 17:00 Multiport VNA: Challenges and Solutions
The continuing progress in mobile communications systems and military/civil monitoring systems generates ever increasing requirements regarding the number of test ports and, at the same time, the performance of the measuring system. Conventional solutions, however, which are based on expanding network analyzers with switch matrixes, often lack the required RF measurement performance or cause an unwanted increase in the measurement time. This workshop session examines the reasons behind this and the pros and cons of multiport network analysis systems with switch matrixes, as compared with "true" multiport network analyzers with integrated test ports.

17:00 - 17:30 Challenges in Millimeterwave Measurements
Measurements at millimeterwave frequencies are more demanding than at microwave frequencies. In addition to system error correction, active device characterization requires precise power calibration and the ability to perform power sweeps for compression point measurements. The workshop session gives an overview of millimeterwave solutions for on-wafer testing and related calibration techniques.  

 

Wednesday 11th October 2017 13:30 – 17:30
5G Communications
Workshop Chair: Meik Kottkamp, 5G Technology Manager, Rohde & Schwarz

LTE, including all its enhancements in LTE-Advanced and LTE-Advanced Pro, has become the dominant cellular technology. It provides the evolutionary path towards 5G, namely New Radio (NR) in 3GPP, which will be specified in 3GPP within the Release 15 time frame. In particular, non-standalone (NSA) operation with LTE-A Pro will be completed by the end of 2017, whereas standalone (SA) operation is aimed for completion in mid-2018. This workshop discusses the key technology components relevant to using the cmWave and mmWave spectrum. R&D measurement aspects are explained in detail. Experts from the test and measurement world provide answers on how to most efficiently solve the main verification tasks resulting from NR.

13:30 - 14:15 Continuing the Success of LTE-Advanced Pro
5G main technology components, test challenges and solution overview Expected initial commercial deployments will focus on non-standalone (NSA) operation, i.e. adding New Radio (NR) technology components to an existing LTE-A network based on the dual connectivity feature. Revolutionary aspects of NR include the use of the cmWave and mmWave spectrum with advanced antenna implementation. This enables dynamic beam steering in combination with spatial multiplexing known as massive MIMO. Furthermore, the required coverage of multiple use cases has resulted in a flexible air interface design using flexible numerology and the introduction of network slicing mechanisms. This workshop session illustrates the most important 5G technology components, explains differences to pre-5G as specified in 5GTF specifications and summarizes the available test and measurement solutions. Selected solutions are detailed in the follow-up presentations.

14:15 - 15:00 Physical Layer (Pre-) 5G Measurements
One of the main challenges for component or transmitter and receiver development of end user device and base stations is the adoption of cmWave and mmWave frequencies as well as significantly increasing the signal bandwidth. Although waveform details are
known from pre-5G specifications such as those published by 5GTF (www.5gtf.org), the detailed 5G waveform design for NR in 3GPP has not been finalized. Furthermore, NR adopts the concept of flexible numerology, e.g. applying different subcarrier spacing and
channel bandwidth. This requires flexible test solutions for generating and analyzing pre- 5G and NR waveforms. This workshop session focuses on physical layer measurement tasks and relevant test solutions.

15:15 - 16:00 Massive MIMO Antenna Verification in a Shielded Environment
Advanced antenna technologies applying massive MIMO and beamforming are key technology components in 5G. While massive MIMO is applicable to both below and above 6 GHz operation, beamforming is of utmost importance at cmWave and mmWave spectrum in order to implement satisfactory cell coverage. From a testing perspective, over-the-air (OTA) measurements are essential and introduce new challenges for verifying the performance of both base stations and end user devices.

Obviously a shielded environment is required to enable reproducible measurement results. This workshop session discusses the challenges resulting from OTA measurements for antenna verification. Measurement solutions offered by Rohde & Schwarz will be explained in detail.   

16:00 - 16:45 Measuring (Pre-) 5G Networks in the Field
Although 3GPP standardization has not yet finalized the first set of NR specifications, extensive trial activities are in progress or are planned for the near future. In addition, pre-5G networks based on the 5GTF (www.5gtf.org) specification are aimed for commercial launch as early as 2018 with ongoing trials in particular in the US market. Generally the coverage of cellular networks operating in the cmWave spectrum and applying beamforming techniques is of high interest. This workshop session discusses and identifies the key signal components in pre-5G and 5G waveforms to perform coverage measurements in the field. Test solutions fulfilling this task are introduced and sample measurement results are explained in detail.

 

Thursday 12th October 2017 12:30 – 16:30 
Radar Applications
Workshop Chair: Dr. Steffen Heuel, Technology Manager A&D, Rohde & Schwarz

Radar has been around for more than one hundred years, ever since Christian Hülsmeyer from Germany patented his “Telemobiloskop” in 1904. Since then, radar has been applied in a variety of applications such as presence detection, air traffic
control, military use and even automotive. These different applications need different radar systems that make use of various frequencies, signals and processing and require versatile test and measurement methods. This workshop presents the latest
radar test and measurement developments – from signal generation, wideband analysis and phase noise testing to simulated RF environments for testing the many radar requirements.

12:30 - 13:45 High-Quality Radar Signals for the Most Demanding Applications
There are two key parameters for radar signals: the first is the purity of the local oscillator (LO) signal, the second is the quality of the pulsed radar signal. The purity of the LO signal is essential for the performance of each radar system. The phase noise performance of the radar limits the capability to resolve small, slowly moving objects in the vicinity of large reflections that could come from clutter echoes. Often signal sources act as a replacement for the actual local oscillator. In this workshop session, phase noise performance of LO signals coming from analog signal sources is discussed and effects on radar performance shown. The second part of this workshop session discusses the quality of the pulsed radar signals. For proper testing of the functionality or sensitivity of radar receivers, the challenge is always the same: accurate short pulses with high level repeatability, high on/off ratio and low duty
cycle are needed from a signal source to measure the true performance of the radar receiver, since these products are designed to work at the utmost technological limit.

13:45 - 14:30 Automotive Radar Signal Analysis in the E Band
Automotive FMCW radars operate typically between 76 GHz and 77 GHz with a signal bandwidth of around 500 MHz. The frequency range between 77 GHz and 81 GHz for automotive radar applications recently became available in some countries. The distance resolution of an FMCW radar is proportional to its signal bandwidth. Therefore, automotive radar manufacturers are already developing FMCW radars with wider bandwidths to get the most out of the available frequency range. The first part of the workshop session presents test and measurement solutions to overcome the challenges of RF measurements in the E band with measurement bandwidths between 500 MHz and 5 GHz. In addition to signal bandwidth, the signal linearity and chirp duration determine radar performance. Therefore, it is important to analyze the automotive radar signal parameters such as chirp direction, chirp rate, frequency deviation, etc. The second part of the workshop session shows an application that automatically demodulates FMCW signals, and displays the main performance parameters.

14:45 - 15:30 An Innovative Phase Noise Measurement Method
Low phase noise is a prerequisite for range and velocity resolution of advanced radar systems. Accurate measurements of phase noise and AM noise of synthesizers, high-end oscillators (OCXO, DRO, etc.), voltage-controlled oscillators (VCO) and components are needed to improve the performance of these systems. A new measurement technique will be introduced that provides state-of-the-art measurement sensitivity, speed and flexibility for absolute phase noise as well as for residual/additive phase noise measurement on continuous wave and pulsed signals featured in the new R&S FSWP phase noise and VCO tester. In addition, extension
to frequencies > 50 GHz up to 500 GHz is presented and transient measurements (frequency/phase over time) are shown for characterization of settling effects of phase-locked loops and VCOs or frequency agile radar systems.     

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