Exhibitor Workshops


- free to attend -






Keysight Technologies Workshops

Location: Room 3, Conference Area on Level 3

HARDWARE + software + people = insights


Connect with the Experts

Keysight Technologies’ test, measurement and software solutions have enabled electronic and communication advancements since 1939. Again this year at European Microwave Week, our ‘Connect with the Experts’ workshops will allow you to meet Keysight’s industry experts and engage with them around four major topics which are critical for the EuMW delegates:

• Radar, Satellite and Electronic Warfare Applications
• Material and Component Characterization
• Research and mm-wave/Terahertz Applications
• Printed Circuit Board & RF Circuit Design

If you would like to register to attend any of these workshops and/or book a meeting with a Keysight expert, please visit www.keysight.com/find/eumw2016 where you will also find detailed information on each individual session and a first look at the solutions Keysight will present this year at European Microwave Week 2016.


Tuesday 4th October 13:00 – 17:30
Radar, Satellite and Electronic Warfare Applications

Moderated by Darren Nicholls, EMEAI Marketing and Development Manager, Aerospace & Defense

Keysight is the world's premier test and measurement provider. Using our expertise in metrology, simulation, and related services, we continue our tradition of providing high quality COTS equipment to the aerospace and defense industries. Our mission also remains the same: helping you focus where it counts. Through expertise in measurement science and test processes, we give you more time for the bigger issues: anticipating today's mission and managing the transition to what comes next. This workshop will explore the available technological approaches for radar, EW signal and environment simulation as well as analysis measurement techniques.

13:00 - 13:45 Real-time Recordings of Wide Bandwidth EW Signals, Event Detection in Post Processing and Pulse Verification.
14:00 - 14:45 Generating Wideband, Multi-channel Radar Signals Using High-speed Arbitrary Waveform Generators
15:00 - 15:45 Enabling Satellite Ground Station Maintenance and Troubleshooting at KA band (26.5GHz to 40GHz)
16:00 - 16:45 Ensuring the Performance of Satellite Systems by Improving Measurement Integrity
17:00 - 17:30 Measuring the Ability of an Airborne Radar to Detect Moving Targets in the Presence of Surface Clutter and Jamming


Wednesday 5th October 09:30 – 13:15
Material and Component Characterization

Moderated by Giovanni D’Amore, EMEAI RF & MW Marketing Brand Manager

Engineers and Researchers working today in education, communications, wireless, aerospace and defence industries with functional, novel materials and their components are faced with increasingly complex measurement challenges and rapidly changing technology. A strong understanding in measurement techniques is essential for success. This workshop is covering the fundamentals of impedance measurements, explain the role of Keysight in material science and component testing, looking at the latest trend for measuring complex multi-function devices in an accurate and repeatable way, to conclude with a look at applications to characterize the electromagnetic properties of the material at microwave and mm-wave frequencies.

09:30 - 10:15 Keysight’s Role in material Science and Components Testing research: an overview
10:30 - 11:15 Advanced Applications for Complete Linear and Non-linear Characterization of Complex Devices
11:30 - 12:15 Devices and Material Characterization from DC to mm-wave and THz
12:30 - 13:15 Advanced Testing Solutions for Impedance measurements


Wednesday 5th October 13:30 – 17:00
Research and mm-wave/Terahertz Applications

Moderated by Giovanni D’Amore, EMEAI RF & MW Marketing Brand Manager

Research often goes beyond scientific discovery to become the discovery of new sciences. As you develop hypotheses, new theorems and theories to expand the world’s knowledge, confidence in measurements is paramount. In research laboratories around the world, Keysight Technologies, Inc. instrumentation and partnership has become an integral part of advanced experimental systems.

As the world’s premier measurement company, Keysight works in close collaboration with engineers, scientists, and researchers
around the globe to meet the communications, electronics challenges of today and tomorrow. This workshop highlights key research areas in which Keysight is involved such as 5G, IoT and mm-wave and THz application and the solutions that can help you meet your research and development objectives.

13:30-14:30 Exploring the challenge of low current and low power measurements in selfpowered and battery powered devices
for future wireless applications in IoT infrastructure
14:45-15:45 Generating and Analyzing mmWave Signals for Imaging Radar and Wideband Communications
16:00-17:00 Technology for the Emerging Terahertz Market


Thursday 6th October 09:30 – 11:30
Printed Circuit Board & RF Circuit Design

Moderated by Vincent Launois, EMEAI EEsof Market Development Manager

Industry trends continue toward smaller form factors and more functionality in low cost packages, including mixed technology components such as MMICs, RFICs, discrete components, antennas and multi-layer packaging. This workshop will show two aspects on how Keysight EDA software helps designers to build first pass correct PCBs & RF/MW circuits.

09:30 – 10:30 New Signal Integrity and Power Integrity tools SIPro & PIPro in ADS 2016
10:45 – 11:30 Silicon RFIC Design Through OpenAccess Interoperability in ADS 2016








National Instruments Workshops


- Free to attend -
Location: Room 6, Conference Area Level 3

AWR Design Forum (ADF) / NI AWR Software User Group Meeting

Date and Time: Tuesday 4th October 12:00 – 16:00

ADF – in conjunction with NI AWR Design Environment User Group Meeting - is scheduled for Tuesday, 4 October. Spend time
to learn about NI solutions that span design through to test for RF and microwave circuits, systems and subsystems. The event will
focus on RF and microwave design and showcase NI AWR Design Environment™ product portfolio of Microwave Office, Visual
System Simulator™, AXIEM, Analyst™ and AntSyn™ as well as co-simulation with LabVIEW. Customers and partners will also be
presenting how they use these software solutions to realize end product design.

Presentations include:
• Antenna Synthesis Capabilities and Preview of New Features - Andrew Wallace, AWR Group, NI
• Advanced GaN Transistor Modelling for High Power MMIC Design - Dr. Jonathan Leckey, MACOM
• GaN MMIC and Packaging Design at Thales UK - Rashed Fazaldin, Thales
• System Level Simulation Using Simplified MHV Power Amplifier Model - Dr. Tony Gasseling, AMCAD Engineering
• A New Nonlinear Modeling Approach for the Analysis of Massive MIMO and Phased Array Transmitter Impairments -
Dr. Christian Fager, Chalmers University
• A Cooperative Software and Measurement Framework for RF PA Design and Linearization - Geneviève Baudoin, ESIEE

To view the complete agenda and to register, visit:

Wednesday 5th October 09:30 – 14:00
RF and Microwave Power Amplifier (PA) Forum

The third annual EuMW RF and Microwave PA Forum will focus on device technologies, characterization, modeling and end-use
applications of RF and microwave PAs. The forum aims to encourage discussion and provide insight into the latest approaches to device models, parameter extraction measurement techniques, process technologies as well as modern PA design flow and theory.

The forum’s agenda is segmented into sequential sessions to allow attendees to selectively attend any/ all presentations of interest.
The PA Forum starts with a Keynote by Dr. Steve C. Cripps and ends with a round up discussion moderated by Dr. Dominic FitzPatrick.

Presentations include:
• Keynote: Clipping Harmonic Contours: A New RF PA Design Tool - Dr. Steve C. Cripps, Cardiff University
• Does Source-pull Really Effect Device Performance - Dr. Tudor Williams, Mesuro
• Circuit Level Simulation Using EPHD Transistor Model - Dr. Tony Gasseling, AMCAD Engineering
• Load Pull in Power Amplifier Design, Where Does it Really Fit? - Dr. Dominic FitzPatrick, PoweRFul Microwave
• Streamlined MMIC Design for High Power, High Frequency Applications - Jeremy Fisher, Wolfspeed
• Design of High-Efficiency Amplifiers With Advanced Synthesis Techniques - Dr. Pieter Abrie, AMPSA

To view the complete agenda and to register, visit:

Wednesday 5th October 14:00 – 17:00
Hands-on: Rapid Prototyping of Real Time Wireless Systems

In today’s competitive wireless research space, the ability to prototype ideas quickly on hardware using real signals is more
important than ever. Attendees will gain hands-on experience with National Instruments’ integrated hardware and software
platform for rapid prototyping of real-time wireless systems using the NI LabVIEW Communications System Design Suite
(LabVIEW Communications) and the NI USRP RIO FPGA-based software defined radio. The final result will be the attendee’s
ability to design, simulate, and prototype a 5-MHz LTE-based real-time OFDM link on a high performance FPGA, and transmit
data over the air using the link designed on the NI USRP RIO. This industrial design workshop will cover the most important aspects
of the idea-to-prototype flow in a single tool, including floatingpoint simulation, floating-point to fixed-point conversion, HW/
SW partitioning, performance-complexity tradeoffs, and finally verification and testing on an FPGA-based software-defined radio.
Note: No prior experience with FPGA’s or NI hardware or software tools is required.

To register, please visit:

National Instruments SPONSORED Workshops

- Free to Attend -
- Course Completion Requires Full Day Attendance -
Location: Room 6
Thursday 6th October 09:30 - 16:00
From Bits to Waves: Building a Modern Digital Radio in 1 Day

In this fun and interactive workshop hosted by Dr. David Ricketts of North Carolina State University, participants will learn the
basic theory of modern digital radios as well as the RF circuits and system used to build them. After an introductory session on digital radios, participants will select an RF building block to design and build. There will be short mini-classes (run in parallel) on each component: double balanced mixer, microstrip filters, low noise amplifiers, power amplifi ers, baluns, etc. The radios will operate
in the ISM 920 MHz band. After the mini-classes, each participant will design their RF component using NI AWR software. In the
afternoon, the designs will be transferred to PCB via a simple “PCB in a bag” method and each component built and tested
using a simple VNA. The workshop will conclude with a full radio test of at transmitter and receiver.

To view the complete agenda and to register, visit:









Rohde & Schwarz Workshops

- Free to attend -
For more information, details and registration: http://www.eumw.rohde-schwarz.com/
Location: Room 2, Conference Area Level 3

Tutorial Seminars - RF Basics in Test and Measurement


Tuesday 4th October 2016 09:30 – 11:00
Fundamentals of Signal Generators and Oscillators (YIG vs. VCO)

During this session, the fundamental concept of an RF and microwave generator will be discussed. Attendees will learn about YIG- and VCO-based synthesizers and how a signal with a constant output power is generated. To set a specific low output power on a signal generator, an internal step attenuator is used. The concepts of mechanical and electronic step attenuators as well as
their advantages and limitations will be shown in detail. Typical specifications for modern signal generators as well as the realization of fundamental analog modulations will be discussed.

The following topics are covered:
• Synthesizer concepts for RF and microwave generators • Comparison of YIG-based and VCO-based synthesizers • How to achieve low phase noise and high output power • Challenges of low phase noise and high output power • Principles of analog and pulse modulations • Fundamental specifications of RF and microwave generators • Advantages of internal generation for 2 GHz wideband signals  


Tuesday 4th October 2016 12:15 - 13:45
Fundamentals of Spectrum Analysis

One of the most frequent measurement tasks in RF and radio communications is the examination of signals in the frequency domain. The instrument that is best suited for this assignment is a spectrum analyzer, one of the most versatile and widely used RF measuring instruments. A versatile, state-of-theart spectrum analyzer provides a large number of setting parameters in order
to handle the steadily rising requirements in the RF and microwave world.

The following topics are covered:

• Signals and their spectra • Block diagrams of modern spectrum analyzers • Theory of operation of super heterodyne analyzers • Understanding resolution bandwidth (RBW) • Understanding video detectors and the use of the video filter (VBW) • Use of the different detectors in the spectrum analyzer • Frequency accuracy and trace processing • Boundaries and uncertainty of the measurement
• Applications • Classical measurements with a spectrum analyzer


Tuesday 4th October 2016 15:30 – 17:00
Fundamentals of Power Measurements (Power Sensors and Applications)

In this tutorial seminar, we give a brief introduction of the term power and clarify how power is measured. This is followed by an overview of the various power sensors that are available to measure and analyze various aspects of a RF/microwave signal, e.g. pulses, overshoots and level transitions, modulated signals and their envelope characteristics. The final part introduces some
power measurement applications in various environments, such as automotive testing, wireless communications, production and aerospace and defense.

The following topics are covered:
• Introduction • Power of CW signals • Pulse power measurements • Crest factor • Two types of sensors: terminating and directional • Thermal power sensors • Multipath diode sensors • Universal wideband power sensors • USB/LAN power sensors - standalone capabilities and applications


Wednesday 5th October 2016 09:30 – 11:00
Fundamentals of Vector Network Analysis

Sophisticated and precise vector network analysis is indispensable in developing advanced, miniaturized RF equipment such as filters and amplifiers.
By measuring the transmission and reflection parameters (S-parameters) of the individual components of an overall system, network analysis allows you to ideally match these parameters, thus ensuring optimum functioning of the system. Correction methods are used to achieve high measurement accuracy.

The following topics are covered:
• Basic terminology in network analysis • Frequency response • Typical effects and conclusions • S-parameter • Setup and functioning of network analyzers • Introduction to calibration • Basic applications • Practical examples


Wednesday, October 5, 2016 11:15 – 12:15
Calibration in Vector Network Analysis

Beside the hardware and accessories used in the network analysis set up, the calibration method and the calibration kit used directly influence the measurement result. To enhance the measurement accuracy, the fundamental calibration methods of network analyzers correct so-called systematical errors.

This lecture will show how to perform a calibration as well as the differences between different calibration methods with respect to the necessary measurement accuracy and the application. The following topics are covered:
• Calibration procedures and their uses • Typical measurement errors • Normalization • One-path, two-port • Full one-port calibration • Full twoport calibration • Definition of calibration standards • Practical examples


Tutorial Seminars – Digital Modulation Basics in Test & Measurement


Thursday, October 6, 2016 09:30 – 12:15
Introduction to Digital Signals and Digital Modulation

This tutorial seminar will show the evolution of RF signals, from analogmodulated RF signals to digitally modulated RF signals. We will introduce the principle of the communications path, from coding, mapping, modulating and transporting the signal over the air interface to demodulating, decoding, demapping and reshaping the information in the receiver.

The following topics are covered:
• Transmission of information – source coding, channel coding and modulation • Analog modulation of RF carriers • Digital modulation of RF carriers • Symbol and symbol rate • Higher order modulation – types of modulation (GMSK, BPSK, QPSK, QAM) • Mapping – effects due to coding • Baseband filtering • Channel capacity • Channel coding with forward error correction (FEC) • Multiple access systems – FDMA, TDMA, CDMA • Measurement parameters in digital modulation


Thursday 6th October 2016 14:30 – 16:00
Understanding Fading and its Effects

In this tutorial session, we uncover the physical phenomena of fading to show what multipath propagation is and what their influences are. We will shed light on the different fading types and their relevant physical effects, such as reflection, refraction and scattering.

The following topics are covered:
• Motivation to speak about fading • Physical phenomena of fading • What is multipath propagation and what are the effects • Typical influences of multipath propagation • Fading – what physical effects are at work here • Types of fading • Pure Doppler fading • Rayleigh fading • Ricean fading • Watterson fading • The microwave link


Technical Workshops

Tuesday 4th October 2016 11:15 – 12:00
Wideband Pulse Analysis with Digital Oscilloscopes

Pulsed signals are common in many applications such as radar or avionic systems. As the signal bandwidth in advanced radar systems has increased over the years, new measurement quantities as well as requirements on the measurement solutions have evolved. The workshop discusses the measurement solution and analysis feature for wideband and pulsed signals using a digital oscilloscope.

Tuesday 4th October 2016 14:00 – 15:15
Antenna Measurements at the New Test Chamber of Rohde & Schwarz

Rohde & Schwarz develops high-quality microwave measurement equipment, diverse test solutions and antenna systems. High-tech and ever advancing antenna systems require knowledge of 3D radiation characteristics over a wide bandwidth. An anechoic chamber not only enables the use of the nearfield measurement technique with subsequent transformation into the far field, it also provides enhanced measurement accuracy and other advantages.

The comprehensive Rohde & Schwarz antenna portfolio covers a wide range, including broadband antennas, omnidirectional and directional antennas. An off-the-shelf system cannot cover the diverse measurement requirements. The workshop presents the company’s choice of measurement system – a 14 m x 10 m x 8 m combined near-field/far-field antenna chamber featuring an
8-axis positioning system. It can handle AUTs up to 200 kg and measure an exceptionally wide frequency range of 200 MHz to 40 GHz. Near-field and farfield measurements in the test chamber are shown. The near-field to far-field transformation algorithm based on spherical multipoles and the one based on equivalent currents are introduced. The visualisation of the current distribution
close to the aperture of an AUT will be demonstrated. Other techniques such as time gating, probe correction and echo suppression that are used at Rohde & Schwarz to further improve the accuracy of measurements are explained.


Wednesday 5th October 2016 12:30 – 13:15
Ensuring VNA Accuracy Using In-Line Calibration Modules

System error correction using a manual kit or an automatic calibration unit is typical in network analysis, and these calibrators must be screwed onto or unscrewed from the test ports. This involves considerable effort and the danger of operating errors, especially with multiport systems. It also raises the question of how long a calibration is valid, above all if the stability of the setup is affected by many cable glands, long cables or environmental influences. Even in systems with restricted access to the reference level, (re)calibration becomes problematic. The presentation deals with innovative calibration modules as a solution for such test systems, their handling, technical details and differences to standard calibration units.

Wednesday 5th October 2016 13:30 – 14:15
Millimetre-Wave Measurement Challenges

Measurements at millimetre-wave frequencies are more demanding than at microwave frequencies. In addition to system error correction, active device characterization requires precise power calibration, which is a special challenge for on-wafer testing. The workshop gives an overview of the current status of millimetre-wave solutions, focusing on active device characterization and on-wafer calibration techniques.

Wednesday 5th October 2016 14:30 – 15:15
High-Speed Signal Integrity Measurements

In recent years, data rates for digital applications have continuously increased. Unlike previous generations, where channel tests were optional, today’s digital cables require compliance tests to achieve certification acceptance. An example of this is the evolving USB Type C standard. Previously, most of the compliance parameters were measured with an oscilloscope, whereas now the vector network analyzer is becoming the tool of choice. One of the driving factors in this development is the need for multiport device tests. In this session we discuss the need for precise multiport S-parameter measurements (e.g. crosstalk measurements such as FEXT, NEXT) and the steps involved in performing them. These measurements are the basis of a proper signal integrity analysis and are required for proper eye-diagram and jitter analysis.

We will also present different de-embedding methods that counteract the impairments to the measurement results caused by the test fixture.

Wednesday 5th October 2016 15:30 – 16:30
Automotive Radar Systems – Radio Testing in the E-band

The progress of advanced driver assistance systems (ADAS) is leading to an increasing number of radar systems in the automotive industry. Radarbased ADAS features include adaptive cruise control, pre-crash protection and collision warning systems. The global trend for automotive radars are E-band systems operating at center frequencies between 77 GHz and 79 GHz depending on the geographical region, with wideband modulation using FM chirp waveforms to reach good target resolution. The workshop gives
a survey of recent trends in the development of automotive radar systems.

A test solution capable of generating and analyzing frequency-modulated continuous wave (FMCW) radar signals in the E-band is presented. This solution uses an ultrawideband chirp sequence modulation with up to 2 GHz bandwidth and demonstrates radar signal analysis and how glitches in the signal can be identified.

The following topics are covered:
• Radar waveforms • Wideband signal analysis • Automatic detection of hopping parameters • Automatic detection of chirp parameter • One-box solution for spectrum analysis up to 85 GHz.

Thursday 6th October 2016 12:30 – 13:15
Advanced Phase Noise Measurement for CW and Pulsed Signals

Accurate and fast phase noise measurements are a common requirement for developing and testing oscillators and synthesizers used in radar and communications equipment. While medium-performance phase noise measurements can be conducted with spectrum analyzers, high sensitivity measurements of a modern low phase noise radar oscillator requires the use of a dedicated phase noise test set. In the case of pulsed signals or the additional requirement for additive phase noise measurements, setting up
and calibrating these test sets can be a very complex task. The workshop reviews the fundamental concepts of measuring phase noise and introduces a new technique that provides state-of-the-art measurement sensitivity and speed for phase noise measurements. The combination of very good internal reference signal sources, high-performance analog-to-digital converters and
signal processing creates a measurement tool for all needs of modern phase noise measurements, including CW and pulsed phase noise, additive phase noise and AM noise.

Thursday 6th October 2016 13:30 – 14:15
Phase Noise Measurement with Spectrum Analyzers

Measuring phase noise with a general-purpose spectrum analyzer is discussed in this session. Due to the excellent internal phase noise performance, recording of baseband I/Q data and today’s digital signal processing possibilities, a lot of tasks formerly addressed only by phase noise analyzers can now be covered with a spectrum analyzer and a phase noise measurement software option.
The same measurement software can also be used on mid-range instruments to cover measurements with lower phase noise requirements.

The following topics are covered:
• Quick introduction to phase noise • Software concept, DSP details • Phase noise measurements (spurs, residual noise, spot noise, AM rejection) • Tracking/digital PLL and measurement performance.


About EuMA

The European Microwave Association (EuMA) is an international non-profit association with a scientific, educational and technical purpose. The aim of the Association is to develop in an interdisciplinary way, education, training and research activities. [more]

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