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Official Publication:

Tutorial Seminars for Young Engineers

Agilent Technologies RF & Microwave Measurement Tutorials

- Free to attend -

For more information, programme details and registration: www.agilent.com/find/eumw2010

Location: Cartier 1

Wednesday 29th September, 09:30 - 10:45
Developing Customized Signal Generation, Measurement, and Analysis Routines

Designing and testing electronic circuits and systems in the aerospace and defense industries faces unique challenges – formats of RADAR/EW, satellite, and other wireless and digital signals are often new, proprietary, or complex. With the growing complexity of signals, the standard signal generation capabilities and analysis routines built into instruments are sometimes not enough. MATLAB ® software enables Agilent instruments to make measurements even when they are not built into the instrument.

This paper demonstrates techniques for generating arbitrary waveforms, testing custom modulation schemes, creating and applying your own filters to signals, making application specific measurements, and developing automated tests using MATLAB and a variety of instruments using example applications.

 

Wednesday 29th September, 11:00 - 12:30
Advances in PNA & PNA-X Based Opto-Electronic Component Analysis for High-Speed and RF-over-Fiber Transmission

This paper explains the principles of frequency domain S-parameter measurements on opto-electronic components and will describe calibration methods for both amplitude and phase response and the application of network analyzer fixturing application for optical receiver (O/E) and optical transmitter (E/O) component measurements. Examples for measurements on opto-electronic components with balanced electrical ports and under various optical and electrical operating conditions will be given.

 

Wednesday 29th September, 13:30 - 17:15
Powerful 3D EM Simulation Fully Integrated in Agilent's Advanced Design System (ADS)

EMPro 2010 is a new modern electro-magnetic simulation design platform that solves EM problems of arbitrarily-shaped, passive structures like connectors, bond wires, antennas, RCS, packages, and more both in frequency and time-domain. EMPro includes full 3D FEM (Finite Element Method and FDTD (Finite Difference Time Domain) electromagnetic fi eld solver, a versatile solid modeling user interface, and unique 3D component technology that bridges 3D EM design environment to ADS circuit design environment . It also enables designers to ensure their design passes regulatory and operator compliance, such as Over-The-Air-performance, SAR (Specifi c Absorption Rate), and HAC (Hearing Aid Compatibility), before going into expensive physical testing. EMPro result viewer also allows designers to process and manipulate various simulation data such as E/H fi eld, voltages and current as well as s-parameters.

Thursday 30th September, 09:30 - 12:00
Practical Magic: Signal Integrity Problems Disappear Using the Right Tools

Today’s high speed digital design engineers are faced with ever increasing data rates that create a multitude of challenges: interconnects become microwave transmission lines, reflections wreak havoc on timing margins and jitter closes the eye diagram. In addition, higher data rates dictate that measurements and models must correlate with each other to ensure the digital system works at all. This educational forum will describe the lifetime of a digital bit throughout the complete design flow.

Experts will explain when to use the right design tools for pre-layout and post-layout project tasks while reducing risks along the way. Correlation of measurements and models is a new requirement for the now critical step of simulation, so we will show real world examples of how this is done. Various types of de-embedding will be discussed with examples. This forum will also present examples of data mining S-parameter and show how to use mode conversion analysis to reduce crosstalk.

 

Thursday 30th September, 13:30 - 14:45
Low Noise Signal Generation and Measurement Alternatives and Techniques

This paper provides the basics of signal generation and measurement technology in terms of applications requiring low noise including both noise fi gure and phase noise. It shows how to effectively generate low noise signals and measure certain components for low-noise and low-spurious performance. In addition, the paper describes how phase noise, AM noise, and spurious signals affect system performance including how these performance issues interfere with pulsed radar's ability to detect the small signal refl ections of moving targets.

 

Thursday 30th September, 15:00 - 17:15
Characterization of Dielectric and Electronic Properties on the Nanometer Scale with Scanning Microwave Microscopy: Introduction, Calibration and Applications

The advances in nano materials and devices depend on accurate RF and Microwave characterization. Today’s microwave and RF probes that are used to probe the MW IC’S and devices are not capable of probing the nano-devices due to nanoscale geometries. Scanning Microwave

Microscopy (SMM) combines the powers of high resolution Scanning Probe Microscopy and high performance microwave Vector Network Analyzers. SMM provides a new area of electrical investigation at RF. In particular, we will address the problem of measurement calibration in nano-scale. Then, results on the measurement of dopant profiles, aF scale capacitance and nano scale biological imaging will be presented.