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Exhibitor Workshops

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Agilent Technologies Workshops

- Free to attend -

For more information, programme details and registration: www.agilent.com/find/eumw2010

Location: Cartier 2

Tuesday 28th September, 09:30 - 10:45

Introduction to LTE-Advanced

After much anticipation the fourth generation (4G) of cellular wireless is very much upon us. The ITU Radiocommunication sector (ITU-R) have been working on their 4G program (IMT-Advanced) since 2008 and in September 2010 solicited candidate technologies from the industry. The IEEE submitted 802.16m, an evolution of 802.16e which was the basis for Mobile WiMAXTM. 3GPP submitted LTE-Advanced, an enhancement to basic Release 8 LTE. This paper will describe the major features of LTE-Advanced which will be standardized in Release 10 of the 3GPP specifi cations. In addition to this explanation of the standards, some of the design challenges will be discussed as well as a brief analysis of the costs and benefi ts of the main LTE-Advanced features.

Tuesday 28th September, 11:00 - 12:15

Theory, Techniques and Validation of Over- The-Air (OTA) Test Methods for Evaluating the Performance of MIMO Mobile Subscribers

Several over-the-air (OTA) test methods have been proposed to characterize the performance of Multiple Input Multiple Output (MIMO) devices. Knowing that antenna gain and spatial correlation are important factors to system performance, it has become necessary to include OTA testing of MIMO antenna performance. This paper will discuss three predominant OTA test methods: the two-stage OTA method, the anechoic chamber method using multiple test probes, and the reverberation chamber method. These OTA methods require the use of a large shielded test chamber, anechoic or refl ective, with probe antenna(s) placed around the MIMO mobile subscriber (MS). In some test confi gurations, the probe antennas are connected to a wireless channel emulator, such as the Agilent N5106A PXB, to emulate real-world multipath environments. In the two-stage method, separate OTA antenna measurements are combined with the channel emulator to reduce the measurement complexity and improve the speed and cost when evaluating the MIMO MS performance.

Tuesday 28th September, 13:30 - 14:45

Four Channel LTE MIMO RF Testing and Debugging

The complexities of implementing multiple antenna techniques can make it diffi cult to troubleshoot and debug hardware performance issues. Increasing the number of antennas and data streams to 4x4 MIMO further compounds the level of complexity in debugging issues. This presentation will show the impact of antenna crosstalk impairments, phase noise, and timing error on four channels LTE MIMO downlink system performance. Troubleshooting techniques with time-coherent multi-channel oscilloscopes and 89600 Vector Signal Analyzer (VSA) software will be discussed to help engineers gain insight into error mechanisms impacting their hardware Error Vector Magnitude (EVM) performance and system-level RF transmitter performance budgets.

Tuesday 28th September, 15:00 - 16:15

Design and Test Challenges of MIPI Digital interfaces like DigRF and M-Phy in the Cellular Industry

The mobile computing market is facing a technical revolution with the convergence on standardized high speed serial interconnects coexisting with proprietary interface between components within mobile devices. Bus standards defi ned by the Mobile Industry processor Alliance (MIPI) alliance are getting rapid adoption, such as the DigRF and M-Phy, used for connection between controller AP, BB-IC and RF-IC. We will review typical physical and protocol domain test challenges associated with these technologies and will discuss how to effi ciently debug, validate and integrate MIPI enabled devices.

Tuesday 28th September, 16:30 - 17:15

3GPP LTE eNB RX Test Challenges

The Long Term Evolution (LTE) cellular technology brings signifi cant new capability to wireless communications, including new modulation types, higher data rates, and wider bandwidths. From a testing standpoint this means more complex conformance testing. There are several new challenges associated with the LTE eNB RX conformance tests from TS36.141. This paper will provide a brief overview of the conformance tests followed by a more in-depth analysis of several new challenges for LTE conformance testing including: creating dynamically changing LTE signals based on closed loop HARQ ACK/NACK feedback and timing adjustment information, creating the wanted and interfering LTE signals with independent fading, and maintaining power accuracy of the resultant test signals.

Wednesday 29th September, 09:30 - 12:15

PNA-X Active Device Measurement Application Workshop

This seminar will focus on active device test (amplifi ers and frequency converters) using the PNA-X. This course will provide a detailed quick-start guide to the best practices for complete amplifi er and converter test. While appropriate for engineers new to Vector Network Analyzers, experienced users of older systems such as the 8510 or 8720 will benefi t by seeing the new, modern methods of measurement. The PNA-X combines features of Spectrum Analyzers, Noise Figure Analyzers, Power Meters and VNAs, applying full error correction and advanced analysis to all applications.

Wednesday 29th September, 13:30 - 15:00

Advanced Nonlinear Device Characterization Utilizing NVNA: focus on High power, memory effect and mixer measurement

This workshop will focus on Agilent's new Nonlinear Vector Network Analyzer (NVNA) measurement capability. A simple measurement confi guration, calibration process and new phase calibration module provide vector corrected nonlinear measurements from 10 MHz to 50 GHz. This new NVNA, based on a standard PNA-X, enables active device designers to accurately measure and model nonlinear device characteristics providing measurements such as calibrated amplitude and cross-frequency phase of frequency spectrum, vector corrected time domain waveforms, X-parameters, and pulse multienvelope domain for analysis of long term memory effects. The resulting NVNA measurements representing the nonlinear device characteristics can be imported into simulation and analysis tools such as Agilent's Advanced Design System (ADS).

Wednesday 29th September, 15:15 - 17:15

X-Parameters: The Emerging Paradigm for Interoperable Characterization, Modeling, and Design of Nonlinear Microwave and RF Components and Systems

X-parameters are the mathematically rigorous superset of S-parameters, applicable to nonlinear (and linear) components under both large-signal and small-signal conditions, taking into account mismatch at fundamental and harmonic frequencies, and correctly predict effects of source harmonics on DUT response. X-parameters enable the hierarchical design of chains of nonlinear components under large-signal drive, such as multi-stage power amplifi ers and multi-chip RF modules. X-parameters measured by Agilent's new nonlinear vector network analyzer (NVNA) can be used, immediately, in Agilent ADS, to design nonlinear circuits. This paper introduces the theory of these new parameters and a few key examples of its applications, including its superiority to “hot S22” in accounting for output match of amplifi ers under largesignal drive.

Thursday 30th September, 9:30 - 10:45
(Cascade Microtech Inc.)

Solving Multi-contact RF Probe Measurement Challenges

Traditional microwave probes have been limited to a pair of signal lines. Many devices require a greater number of high-quality signal contacts than merely two contacts. In this workshop, we review probing options that solve this measurement challenge. We review the available probe architectures and their application tradeoffs, and make recommendations for the best Vector Network Analyzer measurement results using such probes.

Thursday 30th September, 11:00 - 12:15

Enhanced MMIC circuit design and verifi cation techniques

The art of designing MMICs to satisfy speed to market at the lowest cost can be achieved with a good design environment and design methodology. This workshop covers the latest productivity enhancements in the modern high-frequency EDA tools in Agilent EEsof EDA's Advanced Design System (ADS), for fast and accurate MMIC design. In particular we will guide you through the critical steps designers need to carry out in order to achieve the fastest time-to-market at the lowest cost, with a focus on physical design and verifi cation using integrated 3D EM simulation.

 

Thursday 30th September, 13:30 - 14:45

RF and Microwave System Design for Radar, Software Defi ned Radio and commercial wireless applications

This workshop presents an innovative approach to RF and Microwave System Design based on Agilent's new SystemVue platform. The integration of time-domain and frequency-domain simulation technologies offers the possibility to combine accurate analog behavioral models with baseband algorithms for a complete description of the system. SystemVue also integrates the new X-parameter modeling technology which allows the simulation of components extracted from ADS or from measurements. Once the system is completely analyzed, signals can be acquired or generated at any node of the system using Agilent's Signal Generators, Signal Analyzers, Oscilloscopes or Logic Analyzers depending on the frequency and format of the signal.

 

Thursday 30th September, 15:00 - 16:45

Device Characterization Techniques for the 21st Century By Maury Microwave

Device characterization and modeling was always a difficult task and generally includes the interaction of different expertise, resources and instruments. This workshop will introduce the latest trend and technique on this field. Technique like:

- High Power X-Parameters with Tuners

- Mm-wave Noise Parameter measurements

- Active and Hybrid Load Pull using PNA-X with or without mechanical tuners and external signal generators

- Vector-receiver load pull measurements using the PNA-X (our joint AMCAD solution)

 

 

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Rohde & Schwarz Workshops

- Free to attend -

For more information, details and registration: http://www.eumw.rohde-schwarz.com

Location: Cartier 3

Tuesday 28th September, 10:00 - 11:00

Millimeter-Wave Applications

The following topics will be covered by the workshop:

• Signal generation with upconverters
• Spectrum analysis and phase noise measurement with external mixers
• True differential measurements in the mm-wave range with vector network analyzers

Tuesday 28th September, 11:30 - 12:30

True Differential - Measurement vs. Calculation

The following topics will be covered by the workshop:

• True Differential versus Virtual Differential - what's the theory behind this
• How the amplifier structure influences the measurement
• Approaches for measurements on differential DUTs
• Comparison of True Differential and Virtual Differential resultss

Tuesday 28th September, 13:30 - 14:30
(In cooperation with Focus Microwaves Inc)

Noise Parameter Measurement up to Millimeter-Wave Range

The following topics will be covered by the workshop:

• New method for measuring noise figure with a vector network analyzer
• Differences between noise figure and noise parameter
• Noise parameter measurement technique

Tuesday 28th September, 15:00 - 16:00

Long-Distance Group Delay Measurements

The following topics will be covered by the workshop:

• Group delay measurement technique for downconverters with embedded LO
• Long-distance group delay applications and challenges
• Measurement solution with two vector network analyzers via LXI
• Practical demonstrations

[16:30-17:30 slot to be confi rmed]

Wednesday 29th September, 10:00 - 11:00
(In cooperation with AWR Corporation)

Connectivity of Rohde & Schwarz Instruments with AWR® High-Frequency Design Software - LNA Design Example

The following topics will be covered by the workshop:

• Introduction to LNA design with AWR Microwave Offi ce®
• Opportunities for tighter combination of simulation with test and measurement; use cases
• Connecting Rohde & Schwarz test instruments to AWR design environment^TM
• Practical demonstrations

Wednesday 29th September, 11:30 - 12:30
(In cooperation with AWR Corporation)

Connectivity of R&S®WinIQSIM2^TM with AWR Visual System Simulator^TM

The following topics will be covered by the workshop:

• Introduction to system simulation with AWR Visual System Simulator^TM (VSS)
• Latest features for communications design
• Introduction to signal generation with R&S®WinIQSIM2^TM
• Easy generation of standard-compliant signals for LTE, HSPA+, WiMAX^TM, ...
• Additional features: multicarrier and multisegment functionality
• Practical demonstrations

Wednesday 29th September, 13:30 - 16:00
(In cooperation with NMDG N.V., Focus Microwaves Inc & AWR Corporation)

Fast Nonlinear Characterisation and PA Design Using VNAs

The following topics will be covered by the workshop:
• Device measurement in a non-50 Ohm environment using multiple harmonics
• Extended VNAs provide realtime access to dynamic IV at multiple harmonics
• Overview of S-functions and their role in nonlinear modeling and the downstream design processes
• PA design using modern EDA solutions

Wednesday 29th September, 16:30 - 17:15

Theoretical and technical background of Frequency Multipliers (50 GHz to 110 GHz)

The following topics will be covered by the workshop:

• Technical fundamentals
• Performance
• Limitations of a conventional setup
• Advantages of an integrated solution
• Applications

Thursday 30th September, 9:30 - 11:00

Basics of Modern Signal Generators

The following topics will be covered by the workshop:

• Fundamental structures of signal generators
• Challenges in low phase noise and high output power
• High-performance analog and pulse modulations
• Practical demonstrations for typical applications

 

Thursday 30th September, 11:30 - 12:30

Distortion Analysis for Characterization and Modeling of Linear and Nonlinear Components

The following topics will be covered by the workshop:

• Introduction - basic measurement task
• Theory of operation
• Signal fl ow
• Model calculation
• Practical measurement results
• Known data demodulator
• Software - results and features

The Rohde & Schwarz distortion analysis software enables designers of baseband and RF applications to measure and characterize active as well as passive components. The device under test (DUT) stimulus signal can be any signal provided numerically or by a reference measurement. Due to Volterrabased modeling, it is possible to measure nonlinear effects with and without memory as well as simple linear transfer functions. The software controls both the analyzer and the generator and defi nes all necessary settings such as level, frequency, etc. The results are available as numeric data and graphical output, providing a large number of different result evaluation functions. Import and export of numeric and graphical data is possible in a large variety of different formats.

Thursday 30th September, 13:30 - 14:30

Realtime Signal Analysis Embedded in Modern Spectrum Analyzers

The following topics will be covered by the workshop:

• What is realtime? - terms and definitions
• Signal, spectrum and realtime analysis in one box
• Persistence mode for new insight into time-variant phenomena
• Real-time spectrogram for resolving frequency-hopping signals
• Frequency mask trigger – detection of events in the us or even ns range

Modern spectrum analyzers are very fast instruments with a huge capture memory for the analysis of complex signals. However, digital signal processing causes dead time after every sweep or data capturing procedure. In many applications, very important information is lost due to these blind slots. In addition to spectrum analyzers, designers of synthesizers, radar systems or other transmitters therefore need instruments with real-time signal processing capability for their development and optimization tasks. An integrated, all-in-one combination of a signal analyzer, a spectrum analyzer and a real-time analyzer will be introduced in this workshop. In the real-time mode, it captures a 40 MHz wide signal and performs seamless calculation of FFTs. 250000 FFTs are calculated per second with at least 80 % overlap. The real-time spectrum is also displayed and the persistence mode or spectrogram can be used for visualizing time-variant effects. A frequency mask trigger (FMT) enables users to trigger on very short events in the frequency domain for detecting sporadic signals of interest.

 

Thursday 30th September, 15:00 - 16:00

Modern Techniques for Phase Noise Measurements

The following topics will be covered by the workshop:
• Theory of phase noise testing
• Increased sensitivity through cross-correlation up to 50 GHz or higher
• Combination of spectrum analyzer and phase detector for phase noise testing
• Spur detection
• Residual phase noise
• AM noise

The measurement of oscillator phase noise is one of the primary tasks in RF technology. Phase noise has a crucial infl uence on modulation quality, receiver sensitivity and adjacent channel power in nearly all radar applications, especially in moving target indication. Modern implementations of phase noise measurement in T&M equipment combine different methods and support new technologies such as cross-correlation to reduce the test system noise fl oor. The R&S®FSUP signal source analyzer combines phase noise tester, VCO test suite, spectrum and signal analyzer in one unit. Using external mixers or dividers phase noise can be measured up to an offset frequency range of 10 GHz at input frequencies up to 50 GHz or even higher. In addition, effective algorithms for spur detection and additional measurements such as AM noise or residual phase noise for high-end applications are discussed.

 

NXP Workshops

- Free to attend -

Location: Dupin 3

Tuesday 28th September, 13:00-14:30

High Performance RF Defense / Avionics Applications

NXP’s broad RF portfolio spans high-power LDMOS for power amplifiers to the most advanced SiGe:C BiCMOS for RF/IF MMICs. Additionally, our advanced CMOS process for high-speed converters completes the RF front-end. We will present how these COTS products are a perfect fit for the mil aero market and in particular AESA type radar systems.

Tuesday 28th September, 15:00 - 16:30

High Speed Converters

NXP has introduced a new line of ADC and DAC products based on the high speed JESD204A digital serial interface. This new JEDEC standardized serial interface between high speed converters and VLSI baseband processors (FPGA or DSP based) maintains state of the art core converter dynamic performance (SFDR, SNR), while running powerful embedded synchronization and scrambling protocols. The JESD204A serial interface achieves transfer speeds of up to 4Gbps with up to 100cm compliant signal reach. The implications of the serialization and further benefits will be discussed.

Wednesday 29th September, 9:00 - 10:30

High Voltage LDMOS for broadcast and ISM (industrial, scientific and medical) applications

In this workshop, High Voltage LDMOS RF Power devices for use in Broadcast and ISM will be discussed in detail. Being a major supplier of LDMOS RF Power transistors for Broadcast/ISM applications, NXP realizes the importance of ruggedness and power density in these market segments. These topics will be a major focus throughout the presentation. Besides a complete product overview, which ranges from 20- 1200W in VHF, multiple application examples will be discussed, clearly showing the benefits of High Voltage LDMOS.

Wednesday 29th September, 11:00 - 12:30

LDMOS RF power devices for defense and aerospace applications

In this workshop, LDMOS RF Power devices for use in Avionics, L- and S-Band will be discussed in detail. Being a major supplier of LDMOS RF Power transistors for Avionics, L- and S-Band applications, NXP realizes the importance of reliability in these market segments - it will be a focus topic throughout the presentation. Besides a complete product overview, which ranges up to 600W in Avionics and L-Band, multiple application examples will be discussed, clearly showing the benefits of LDMOS above the incumbent bipolar technology.

Wednesday 29th September, 13:00-14:30

High Performance RF Defense / Avionics Applications

NXP’s broad RF portfolio spans high-power LDMOS for power amplifiers to the most advanced SiGe:C BiCMOS for RF/IF MMICs. Additionally, our advanced CMOS process for high-speed converters completes the RF front-end. We will present how these COTS products are a perfect fit for the mil aero market and in particular AESA type radar systems.

 

National Instruments Workshops

- Free to attend -

Location: Dupin 4

 

Today's complex RF systems require a fast and flexible test platform to deliver reliable measurements from prototype to manufacturing. In fact, NI modular RF instruments incorporate technologies such as multicore processors and PCI Express to achieve measurement speeds that are 5X to 10X faster than traditional instruments in automated test applications. This platform for communications test operates from DC to 6.6 GHz with up to 100 MHz of instantaneous RF bandwidth.

Tuesday 28th September, 10:00 - 12:00

New Technologies for Modernized RF and Microwave Test Solutions

With the rapid advancements in RF and microwave technologies, this workshop will to show how you can incorporate these technologies to modernize your RF and microwave test solutions. We will demonstrate modernizations for coherent multi-channel measurements and generation; real-time spectral analysis and onthe- fly channel impairments; wideband record and playback, and parallel test techniques. You will also learn how PXI Express, FPGAs, multi-core processors, and modular RF and microwave instrumentation architectures make these advancements possible.

Names:

Michael Schneider – Group Manager, Test Products – National Instruments

David Broadbent – Product Manager, RF & Wireless Test - National Instruments

Jin Bains – R&D Manager, RF & Wireless Test – National Instruments

Workshop Organiser:

Michael Schneider – michael.schneider@ni.com

www.ni.com/fr

 

 

Anritsu Workshops

- Free to attend -

Location: Cartier 1

Tuesday 28th September, 15:00 – 16:00

Active Device Design and Testing Using the VectorStar Network Analyzer

This seminar will discuss the unique benefits available to the amplifier design and test engineer when using the VectorStar network analyzer.

The presentation will include:

• gain compression testing of small signal amplifiers
• system harmonic testing of high power nonlinear base station amplifiers
• memory effects and bias network conformance measurements
  in the RF bands
• small signal amplifier design using load pull techniques
• nonlinear amplifier design using the Nonlinear VectorStar VNA
• harmonic load pull using active and passive tuners
• true differential load pull measurements

 

In addition, the presentation will briefly discuss some of the many advantages of a 70 kHz start frequency in a VNA including:

• increased accuracy of transistor models incorporating low frequency DC terms
• improvements in modeling and time domain analysis using a broadband 70 kHz to 110 GHz frequency span in a single coaxial connection
• highest accuracy in TDR signal integrity analysis using low pass time domain techniques

 

www.anritsu.com