Tutorial Seminars for Young Engineers
 Agilent Technologies Workshops
RF & Microwave Measurement Tutorials
– Free to attend –
For more information, programme details and registration: www.agilent.com/find/eumw2008
Location: Room G
Organiser
Pr Michel Begue, (Session Chair), Université Pierre et Marie Curie, Agilent Technologies. Each session will be presented by Agilent Technologies and industry expert in each domain.
Engineers, future EE PhDs working today in education and research are faced with increasingly complex measurement challenges and rapidly changing technology. A strong foundation in basic measurement techniques is essential for success. These workshops will improve your understanding of fundamental RF and Microwave measurements, including real applications, instruments hands-on, thus improving your efficiency and effectiveness whether you are in research or design & verification.
Wednesday 29th October, 09:30 – 10:50
The Basics of Waveform Creation
Waveforms customized for specific applications are most often created programmatically, within a simulation environment like ADS or a programming environment such as MATLAB, VEE or one of many other tools. The paper will survey these waveform creation methods providing insight into which solution may be best for specific applications. It will review the basics on the signals required to test a variety of products, from amplifiers to highly secure communication systems. These signals may be as simple as a single frequency sinusoid or as complex as a digitally modulated carrier. The paper will also address the basics of signal generators and their applications. We will review block diagrams where appropriate and also discuss signal generator specifications.
Wednesday 29th October, 11:00 – 12:20
Wideband Interconnect Characterization
Presenter: Dr. Ing Uwe Arz Physikalisch - Technische Bundesanstalt (PTB)
The course will cover microwave on-wafer measurement methods and their applications to electronic interconnect characterization. The course will begin with a tutorial on microwave frequency-domain and on-wafer measurement fundamentals. We will then discuss the extension of these frequency-domain methods to the characterization of single-moded high-speed interconnects on lossless and lossy substrates, including VLSI interconnects. In the last part of the tutorial we will talk about the experimental characterization of multi-conductor transmission lines carrying two fundamental propagation modes. Fundamental differences between symmetric and asymmetric coupled lines will be highlighted.
Wednesday 29th October, 14:00 – 16:00
Modern Spectrum and Signal Analysis
Spectrum Analyzers have advanced considerably in recent years. This tutorial will look at why spectrum analysis is important in a number of different applications and how to measure system and device performance using a spectrum analyzer. We will investigate the advances in modern spectrum analyzers and the benefits they bring to enable advanced signal analysis measurements. You will then get to know the specifications that are important
Thursday 30th October, 09:30 – 10:50
Time domain Analysis using a Network Analyzer – Theory and practical examples
Time domain analysis is useful for measuring impedance values along a transmission line and for evaluating a device problem (discontinuity) in time or distance. Time domain display provides a more intuitive and direct look at the device under test (DUT) characteristics and gives more meaningful information concerning the broadband response of a transmission system than other measuring techniques by showing the effect of each discontinuity as a function of time or distance. This document will focus on time domain analysis (displays) generated from vector network analyzers (VNAs). The intent is to provide engineers with frequency domain background, an in-depth view of how a time domain display is created from frequency domain data (S-parameters) and how to apply the time domain display to common problems in RF systems
Thursday 30th October, 11:00 – 12:20
Design tips on high performance oscillators – effective use of a signal source analyzer and a network analyzer
This tutorial offers several examples of design considerations on highperformance oscillators in RF and microwaves.
A good example of collaborative work shows that a network analyzer and a signal source analyzer are efficiently combined to design a lownoise stable oscillator. Particularly focusing on the relation between base-band noise and modulation noise, a new approach to utilize RF CMOS components in oscillator design will be discussed. It is well known that frequency stability and phase noise performance of high frequency oscillators may heavily depend on circuit structure (electrically and mechanically). Besides mechanical instability, oscillator’s circuit topology or configuration difference often results in different stability in frequency or phase even if the same resonator or frequency-tuning component is used.
Keeping the PSRR (power supply rejection ratio) of an oscillator higher is also very important because the poor PSRR tends to degrade oscillator’s phase fluctuation and amplitude noise directly when the oscillator is operated with a noisy power supply.
Thursday 30th October, 14:00 – 16:00
Understand and Improve OscilloscopeMeasurements at High-Frequencies
Refresh and deepen oscilloscope measurement basics. Find out about the importance of active and differential probing in today’s state of the art designs to achieve accurate results. We will continue with the latest trends in mixed analogue and digital design. The Agilent Mixed Signal Oscilloscope will be used to demonstrate how you can uncover details inside those mixed circuits like never before. Finally the aspects of high frequency signal characterization are covered including some practical jitter measurements
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